Sophisticated Central Instrumentation Facility (SCIF) — IIT Dharwad

To cater to the Research and Development (R&D) activities at IIT Dharwad and surroundings, SCIF is being established at IIT Dharwad. The facility consists of state-of-the-art instruments which will be useful in carrying out cutting-edge research in various fields of Science and Engineering and Material science. The SCIF houses variety of highly sophisticated instruments which includes Field emission scanning electron microscopy (FE-SEM) Atomic Force Microscopy (AFM), Universal Testing Machine (UTM), Nuclear Magnetic Resonance (NMR) spectrometer, Probe station, UV-Vis-NIR spectrophotometer, Fluorimeter and Powder X-ray Diffraction etc.

In charges

Dr. Santosh Kumar
Dr. Santosh Kumar
FiC Sophisticated Central Instrumentation Facility (SCIF)

Facilities

1) Atomic Force Microscope (AFM)

AFM is primarily used to get the 3D images and thickness profiles of nanostructures. This equipment has all the standard imaging modes (contact, true non-contact, tapping, phase imaging). The facility is also equipped with accessories that can be used to study the thermal, electrical, chemical, dielectric etc. properties of material. This equipment can be used to characterize thin film as well liquid samples.

Model No: Park Systems NX 10

2) Fluorimeter

The equipment is useful in studying the fluorescent characteristics and to measure the quantum yields of the compounds, in solution, thin films and solid state. The instrument is coupled with integrating sphere which will enable measurement of absolute quantum yields of the fluorescent samples (solution and thin film/solid state).

Model No: Perkin Elmer: FL6500

3) Nuclear Magnetic Resonance Spectrometer (NMR)

The facility will be useful in structure determination, quantification, and in the analysis of purity of chemical compounds. The instrument can record 1D- and 2D-1H, 13C and many more heteronuclear (19F, 31P, 14N, 11B, etc.) spectra. It is capable of characterizing both in solution and solid state samples.

Model No: Jeol:400 MHz NMR spectrometer

4) UV-Vis-NIR Spectrophotometer

The instrument is useful in studying the absorption characteristics of organic/inorganic compounds which absorbs in UV, visible and Infra-red region of the spectrum. It can also assist in identification and determination of the concentration of the unknown compounds. The equipment is also capable of characterizing solution, thin-film, powder state samples.

Model: Cary 5000

5) Universal Testing Machine (UTM)/Axial Torsion Testing Machine

The 100 kN capacity UTM can be employed to conduct tests including fJ1C tests by introducing fatigue-crack, low-cycle and high-cycle fatigue, tensile (flat and round specimens), compression and flexural tests. The 25 kN capacity UTM can be employed to conduct tests including monotonic axial and torsional loadings, Dynamic axial and torsional loading test, a combination of axial and torsional loadings which are in- and out-of-phase. The specimens include flat, round and tubular specimens.

Model No(s): BISS: 100 kN and 25 kN/250 Nm (ATTS)

6) High Performance Computing

The HPC facility consists of 31 nodes with all CPU cores. The system is connected to the Intel Omnipath infiniband and has 100 TB storage with a parallel file system. The compute nodes have 20 cores per socket and 2 sockets per node and with the following basic info. 1 Master node: (40 cores, 2x Intel Xeon Gold 6146 processor; with 384 GB RAM) 31 Compute nodes: (40 cores each, 2x Intel Xeon Gold 6146 processor; with 192 GB RAM/node). The total theoretical TeraFlops for this cluster are 90TF. The machines are of Fujitsu make and are housed in the smart-rack with precision cooling. The DGX box of nVIDIA for AI/ML kind of workloads is also integrated into the smart rack.

7) Powder X-ray Diffraction (PXRD)

It is a rapid, non-destructive analytical technique and an indispensable tool in material science, chemistry, geology, and pharmaceuticals used for characterizing crystalline materials and gaining insights into their structure and properties. When a crystalline sample is exposed to an X-ray beam of known wavelength, a unique diffraction pattern is generated. If the material has more than one material or phase, then the diffraction patterns for each material are overlapped. By the identification of each pattern within the diffractogram, individual materials or phases can be identified and quantified.
From the interpretation of the observed diffraction patterns using PXRD technique, we will be able to:

  • Identify the crystalline phases present in the given material
  • Measure crystallite/crystal domain size within discrete crystalline phases
  • Calculate unit cell dimensions through pattern indexing
  • Phase quantify using standard methods such as simple profile fitting, LeBail, Pawley or Rietveld refinements.

Model: Malvern Empyrean Series 3

8) Probe Station

SPS6 Manual DC/RF Probe Station is Wafer-level electrical measurements of electronic devices and samples. The sample chuck temperature variation is from room temperature to 300 °C.

Model: SPS6 Manual DC/RF Probe Station

9) Field Emission Scanning Electron Microscope (FESEM)

The FESEM along with Oxford Energy Dispersive Spectrometer (EDS) is a sophisticated electron microscope that is used to study the morphology, topography and composition of nanomaterials and nanostructures. This microscope is capable of characterizing conducting, semiconducting and non-conducting samples including polymers. The facility also has the metal sputter coater to aid in the characterization of insulating samples.

Model: Gemini 300 with Oxford EDS

10) Powder Bed Fusion Metal 3D Printer

The metal 3D printer based on the powder bed fusion technology is used primarily to manufacture the customized aerospace, medical and automotive components. Metal 3D printer works on the layer-by-layer material build-up approach. This toolless manufacturing method can produce fully dense metallic parts in short time with high precision.

In Powder bed fusion technology each powder bed layer is selectively fused by using energy source, like laser, is the most promising additive manufacturing technology that can be used for manufacturing small, low volume, complex metallic parts.

Booking — Internal Users

Click Book Now to open the Google Form for that instrument (opens in a new tab).

 
Sl. No.FacilitiesBooking
1Atomic Force Microscope (AFM)Book Now
2FluorimeterBook Now
3Field Emission Scanning Electron Microscope (FESEM)Book Now
4Nuclear Magnetic Resonance Spectrometer (NMR)Book Now
5UV-Vis-NIR SpectrophotometerBook Now
6Universal Testing Machine (UTM) / Axial Torsion Testing MachineBook Now
7Probe StationBook Now
8Powder X-ray Diffraction (P-XRD)Book Now
9High Performance Computing (HPC) 

General Information

  1. Check the charges of facility before making payment.
  2. Payment has to be made in advance ONLY using Electronic Transfer.
  3. Electronic Transfer (NEFT) to the following account:

Annexure-1: Sample Analysis Charges

 

Field Emission Scanning Electron Microscope (FESEM):

 Academic InstitutionsNational labsIndustry and othersInternal academic users 
Sputter coater₹500₹500₹500 Per sample
FESEM₹2500₹3000₹6000 Per sample
FESEM+EDS₹3500₹4000₹8500 Per sample
 

Atomic Force Microscope (AFM) (inclusive of GST):

 Academic InstitutionsNational labsIndustry and othersInternal academic users 
AFM₹1500₹2000₹5000 Per sample
 

Nuclear Magnetic Resonance spectrometer (NMR) (400 MHz instrument) (inclusive of GST):

 Academic InstitutionsNational labsIndustry and othersInternal academic users 
Solution NMR+ (1H, 31P, 19F, 11B, 13C)CDCl3: ₹250₹250₹1200 Per sample
1H in other solvent₹500₹500₹1450 Per sample
13C in CDCl3 (<30 min)₹550₹550₹1250 Per sample
13C in CDCl3 more than 30 min - 550*X/0.5 (Where X is no. of hours run time for each sample) Considering X=1₹1100₹1100  Per Hour
13C in other solvent (>30 Min)₹700₹700₹1000 Element
13C in other solvent more than 30 Min- 700*X /0.5 (where X is no. of hours run time for each sample) considering X=1₹1400₹1400₹2000 Per Hour
1H,13C and other nuclei (Solid)₹1000₹3100₹2400 Per Hour
DEPT 90₹700₹700₹1000 Per Hour
E13C_HSQC (30Min)₹550₹550₹1250 Per Hour
HMBC (30Min)₹550₹550₹1250 Per Hour


+ For the measurements in any other solvents, pls contact us.

*If the time for a measurement exceeds 30 mins, every additional 30 mins will be charged on pro rate basis.

 

UV-Vis spectrophotometer (inclusive of GST):

 Academic InstitutionsNational labsIndustry and othersInternal academic users 
Solution state₹100₹150₹500 Per sample
Solid state₹200₹300₹1000 Per sample
 

Fluorimeter (inclusive of GST):

 Academic InstitutionsNational labsIndustry and othersInternal academic users 
Solution state₹100₹150₹500 Per sample
Solid state₹200₹300₹1000 Per sample
Additional charges for Quantum yield calculations (integrating sphere)₹100₹150₹500 Per sample
 
 Non-IITDh Academic InstitutionsNational labsInternal usersIndustry and others
Tensile Test₹150 *₹300 * ₹600 *
Compression₹150 *₹300 * ₹600 *
Torsion₹150 *₹300 * ₹600 *
Axial Torsion₹300 *₹600 * ₹1200 *
Three Point Bend₹300 *₹600 * ₹1200 *
KIc (Pre-Crack + testing)(450 + 225)*(900 +450)* (1800 +900)*
JIc (Pre-Crack + Testing)(450 + 225)*(900 +450)* (1800 +900)*
Fatigue Crack Growth (Pre-crack+Testing)(450+450#)(900+900#) (1800+1800#)
Uniaxial Fatigue375#750# 1500#
Three Bend Fatigue375#750# 1500#
Torsion Fatigue375#750# 1500#
Tension-Torsion Fatigue450 #900 # 1800 #


* Per sample       # Per hour

 

Accessories (Rates as per the respective tests)

AccessoriesNon-IITDh Academic (INR)National R&D Lab. (INR)Industries and Non Govt.Agencies(INR)
Extensometer75150300
Clip On Gauge75150300
 
OperationsAcademiaIndustry
Lathe operations for sample preparation for Mechanical testingRs 250 per sampleRs. 1000 per sample


1. Samples and Fixtures Fabrications Charges

The facility caters to ASTM or their equivalent standard. The samples appropriate to these tests must be provided by the users. However, to help end users, we can also prepare a limited set of standard samples using our fabrication facility. The rates for feasible sample preparation at our fabrication facility are given in the following table. The rates are based on those levied at IITK.

 

P-XRD:

 Academic InstitutionsNational labsInternal Academic usersIndustry and others
Normal theta to 2theta scan (15 min Per sample)50010001252500
GIXRD for thin films (15 min Per sample)80016005004000


Probe Station:
Rs. 200 per day - working hours
Rs. 50 per Hour

Deepak P P
Deepak P P
(Fluorimeter)
Ramachandran K
Ramachandran K
(P-XRD)
Praveen D Naikar
Praveen D Naikar
(FESEM, AFM)
Sukanya S T
Sukanya S T
NMR, UV-Vis NIR Spectrometer
Anand Kishore
Anand Kishore
UTM
Shikha Kumari
Shikha Kumari
Probe Station

📞 Contact Us

Sl.noFacilitiesEmail id
1Atomic Force Microscope (AFM)op.afm@iitdh.ac.in
2Fluorimeterop.uvfluori@iitdh.ac.in
3Field Emission Scanning Electron Microscope (FESEM)op.fesem@iitdh.ac.in
4High Performance Computinghpcfic@iitdh.ac.in
5Nuclear Magnetic Resonance Spectrometer (NMR)op.nmr@iitdh.ac.in
6UV-Vis-NIR Spectrophotometerop.uvfluori@iitdh.ac.in
7Universal Testing Machine (UTM)/Axial Torsion Testing Machineop.utm@iitdh.ac.in
83D printer(To be added)
9P-XRDop.pxrd@iitdh.ac.in
10Probe Stationop.probestation@iitdh.ac.in